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[n]	R. Jiang, J. Chen, and Y. B. Leng, “High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 166-169. doi:10.18429/JACoW-IBIC2020-WEPP28

For LaTeX

%\cite{Jiang:IBIC20-WEPP28} \bibitem{Jiang:IBIC20-WEPP28} R. Jiang, J. Chen, and Y. B. Leng, \textquotedblleft{High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 166--169. \url{doi:10.18429/JACoW-IBIC2020-WEPP28}

For BibTeX

@inproceedings{jiang:ibic20-wepp28, author = {R. Jiang and J. Chen and Y. B. Leng}, title = {{High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis}}, booktitle = {Proc. IBIC'20}, pages = {166--169}, paper = {WEPP28}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-WEPP28}, url = {http://accelconf.web.cern.ch/ibic2020/papers/WEPP28.pdf}, language = {english} }

References

• R. Jiang, J. Chen, and Y. B. Leng, “High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 166-169.