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[n]	A. F. D. Morgan and G. Rehm, “Design for the Diamond Longitudinal Bunch-by-Bunch Feedback Cavity”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 340-343. doi:10.18429/JACoW-IBIC2016-TUPG12

[n]	J. Wan et al., “Prototype Design of Wire Scanner for SHINE”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 285-287. doi:10.18429/JACoW-IBIC2020-THPP36

For LaTeX

%\cite{Morgan:IBIC16-TUPG12} \bibitem{Morgan:IBIC16-TUPG12} A. F. D. Morgan and G. Rehm, \textquotedblleft{Design for the Diamond Longitudinal Bunch-by-Bunch Feedback Cavity}\textquotedblright, in \emph{Proc. IBIC’16}, Barcelona, Spain, Sep. 2016, pp. 340--343. \doi{10.18429/JACoW-IBIC2016-TUPG12} %\cite{Wan:IBIC20-THPP36} \bibitem{Wan:IBIC20-THPP36} J. Wan \emph{et al.}, \textquotedblleft{Prototype Design of Wire Scanner for SHINE}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 285--287. \doi{10.18429/JACoW-IBIC2020-THPP36}

For BibTeX

@inproceedings{morgan:ibic16-tupg12, author = {A. F. D. Morgan and G. Rehm}, title = {{Design for the Diamond Longitudinal Bunch-by-Bunch Feedback Cavity}}, booktitle = {Proc. IBIC'16}, pages = {340--343}, paper = {TUPG12}, venue = {Barcelona, Spain, Sep. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2016-TUPG12}, url = {https://jacow.org/ibic2016/papers/TUPG12.pdf}, language = {english} } @inproceedings{wan:ibic20-thpp36, author = {J. Wan and others}, title = {{Prototype Design of Wire Scanner for SHINE}}, booktitle = {Proc. IBIC'20}, pages = {285--287}, paper = {THPP36}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-THPP36}, url = {http://accelconf.web.cern.ch/ibic2020/papers/THPP36.pdf}, language = {english} }

References

• A. F. D. Morgan and G. Rehm, “Design for the Diamond Longitudinal Bunch-by-Bunch Feedback Cavity”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 340-343.
• J. Wan et al., “Prototype Design of Wire Scanner for SHINE”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 285-287.