[n] J. Wan et al., “Prototype Design of Wire Scanner for SHINE”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 285-287. doi:10.18429/JACoW-IBIC2020-THPP36
%\cite{Wan:IBIC20-THPP36} \bibitem{Wan:IBIC20-THPP36} J. Wan \emph{et al.}, \textquotedblleft{Prototype Design of Wire Scanner for SHINE}\textquotedblright, in \emph{Proc. IBIC’20}, Santos, Brazil, Sep. 2020, pp. 285--287. \url{doi:10.18429/JACoW-IBIC2020-THPP36}
@inproceedings{wan:ibic20-thpp36, author = {J. Wan and others}, title = {{Prototype Design of Wire Scanner for SHINE}}, booktitle = {Proc. IBIC'20}, pages = {285--287}, paper = {THPP36}, venue = {Santos, Brazil}, series = {International Beam Instrumentation Conference}, number = {9}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2020}, issn = {2673-5350}, isbn = {978-3-95-450222-6}, doi = {10.18429/JACoW-IBIC2020-THPP36}, url = {http://accelconf.web.cern.ch/ibic2020/papers/THPP36.pdf}, language = {english} }