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[n]	M. Siano et al., “Two-Dimensional Beam Size Measurements with X-Ray Heterodyne Near Field Speckles”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 176-179. doi:10.18429/JACoW-IBIC2021-TUOA06

[n]	A. Seidel and J. Osterhoff, “Characterizing Ultralow Emittance Electron Beams using Structured Light Fields”, presented at the IBIC'21, Pohang, Korea, Sep. 2021, paper TUOA02, unpublished. 

[n]	G. L. Orlandi, P. Craievich, M. M. Dehler, R. Ischebeck, F. Marcellini, and D. Staeger, “Charge Measurements in SwissFEL and Results of an Absolute Charge Measurement Method”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 341-348. doi:10.18429/JACoW-IBIC2021-WEOB01

For LaTeX

%\cite{Siano:IBIC21-TUOA06} \bibitem{Siano:IBIC21-TUOA06} M. Siano \emph{et al.}, \textquotedblleft{Two-Dimensional Beam Size Measurements with X-Ray Heterodyne Near Field Speckles}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 176--179. \doi{10.18429/JACoW-IBIC2021-TUOA06} %\cite{Seidel:IBIC21-TUOA02} \bibitem{Seidel:IBIC21-TUOA02} A. Seidel and J. Osterhoff, \textquotedblleft{Characterizing Ultralow Emittance Electron Beams using Structured Light Fields}\textquotedblright, presented at the IBIC’21, Pohang, Korea, Sep. 2021, paper TUOA02, unpublished. %\cite{Orl:IBIC21-WEOB01} \bibitem{Orl:IBIC21-WEOB01} G. L. Orlandi, P. Craievich, M. M. Dehler, R. Ischebeck, F. Marcellini, and D. Staeger, \textquotedblleft{Charge Measurements in SwissFEL and Results of an Absolute Charge Measurement Method}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 341--348. \doi{10.18429/JACoW-IBIC2021-WEOB01}

For BibTeX

@inproceedings{siano:ibic21-tuoa06, author = {M. Siano and others}, title = {{Two-Dimensional Beam Size Measurements with X-Ray Heterodyne Near Field Speckles}}, booktitle = {Proc. IBIC'21}, pages = {176--179}, paper = {TUOA06}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-TUOA06}, url = {https://jacow.org/ibic2021/papers/TUOA06.pdf}, language = {english} } @unpublished{seidel:ibic21-tuoa02, author = {A. Seidel and J. Osterhoff}, title = {{Characterizing Ultralow Emittance Electron Beams using Structured Light Fields}}, booktitle = {Proc. IBIC'21}, pages = {}, paper = {TUOA02}, venue = {Pohang, Korea}, intype = {presented at the}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, note = {presented at IBIC'21, Pohang, Korea, Sep. 2021, paper TUOA02, unpublished}, language = {english} } @inproceedings{orl:ibic21-weob01, author = {G. L. Orlandi and P. Craievich and M. M. Dehler and R. Ischebeck and F. Marcellini and D. Staeger}, title = {{Charge Measurements in SwissFEL and Results of an Absolute Charge Measurement Method}}, booktitle = {Proc. IBIC'21}, pages = {341--348}, paper = {WEOB01}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-WEOB01}, url = {https://jacow.org/ibic2021/papers/WEOB01.pdf}, language = {english} }

References

• M. Siano et al., “Two-Dimensional Beam Size Measurements with X-Ray Heterodyne Near Field Speckles”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 176-179.
• A. Seidel and J. Osterhoff, “Characterizing Ultralow Emittance Electron Beams using Structured Light Fields”, presented at the 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, paper TUOA02, unpublished.
• G. L. Orlandi, P. Craievich, M. M. Dehler, R. Ischebeck, F. Marcellini, and D. Staeger, “Charge Measurements in SwissFEL and Results of an Absolute Charge Measurement Method”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 341-348.