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[n]	M. J. de Loos, S. B. van der Geer, J. I. M. Botman, O. J. Luiten, and M. J. van der Wiel, “Production of Ultra-Short, High Charge, Low Emittance Electron Bunches using a 1 GV/m DC Gun”, in Proc. PAC'99, New York, NY, USA, Mar. 1999, paper THP130, pp. 3266-3268. 
[n]	B. Cheymol, E. Bravin, C. Dutriat, and T. Lef?¿vre, “Design of a New Emittance Meter for LINAC4”, in Proc. DIPAC'09, Basel, Switzerland, May 2009, paper TUPD42, pp. 396-398. 
[n]	S. C. P. Albright, M. E. Angoletta, D. Barrientos, A. Findlay, M. Jaussi, and J. C. Molendijk, “Direct Impedance Measurement of the CERN PS Booster Finemet Cavities”, in Proc. IPAC'22, Bangkok, Thailand, Jun. 2022, pp. 2064-2067. doi:10.18429/JACoW-IPAC2022-WEPOTK013
[n]	M. J. de Loos, F. B. Kiewiet, O. J. Luiten, S. B. van der Geer, and M. J. van der Wiel, “A High-Brightness Pre-Accelerated RF-Photo Injector”, in Proc. EPAC'02, Paris, France, Jun. 2002, paper TUPRI061, pp. 1831-1833. 
[n]	R. Miyamoto, A. Jansson, S. E. Kopp, and M. J. Syphers, “Geometrical Interpretation of Nonlinearities from a Cylindrical Pick-up”, in Proc. PAC'07, Albuquerque, NM, USA, Jun. 2007, paper FRPMS004, pp. 3862-3864. 
[n]	K. Buerkmann-Gehrlein et al., “Status of the Metrology Light Source”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPLS014, pp. 3299-3301. 

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