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[n]	B. X. Yang, S. H. Lee, J. W. Morgan, and H. Shang, “High-Energy X-Ray Pinhole Camera for High-Resolution Electron Beam Size Measurements”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 504-507. doi:10.18429/JACoW-IBIC2016-TUPG66

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