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[n]	Y. C. Jing et al., “Design to Achieve Uniform Electron Beam in Coherent Electron Cooling”, presented at the COOL2023, Montreux, Switzerland, Oct. 2023, paper THPAM2R2, unpublished. 

[n]	C. A. Andre et al., “Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool”, in Proc. DIPAC'11, Hamburg, Germany, May 2011, paper MOPD60, pp. 185-187. 

For LaTeX

%\cite{Jing:COOL2023-THPAM2R2} \bibitem{Jing:COOL2023-THPAM2R2} Y. C. Jing \emph{et al.}, \textquotedblleft{Design to Achieve Uniform Electron Beam in Coherent Electron Cooling}\textquotedblright, presented at the COOL2023, Montreux, Switzerland, Oct. 2023, paper THPAM2R2, unpublished. %\cite{Andre:DIPAC11-MOPD60} \bibitem{Andre:DIPAC11-MOPD60} C. A. Andre \emph{et al.}, \textquotedblleft{Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool}\textquotedblright, in \emph{Proc. DIPAC’11}, Hamburg, Germany, May 2011, paper MOPD60, pp. 185--187.

For BibTeX

@unpublished{jing:cool2023-thpam2r2, author = {Y. C. Jing and others}, title = {{Design to Achieve Uniform Electron Beam in Coherent Electron Cooling}}, booktitle = {Proc. COOL2023}, pages = {}, paper = {THPAM2R2}, venue = {Montreux, Switzerland}, intype = {presented at the}, series = {International Workshop on Beam Cooling and Related Topics}, number = {14}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {4}, year = {2024}, issn = {2226-0374}, isbn = {978-3-95-450245-5}, note = {presented at COOL2023, Montreux, Switzerland, Oct. 2023, paper THPAM2R2, unpublished}, language = {english} } @inproceedings{andre:dipac11-mopd60, author = {C. A. Andre and others}, title = {{Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool}}, booktitle = {Proc. DIPAC'11}, pages = {185--187}, paper = {MOPD60}, venue = {Hamburg, Germany, May 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/DIPAC2011/papers/MOPD60.pdf}, language = {english} }

References

• Y. C. Jing et al., “Design to Achieve Uniform Electron Beam in Coherent Electron Cooling”, presented at the 14th International Workshop on Beam Cooling and Related Topics (COOL2023), Montreux, Switzerland, Oct. 2023, paper THPAM2R2, unpublished.
• C. A. Andre et al., “Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool”, in Proc. 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11), Hamburg, Germany, May 2011, paper MOPD60, pp. 185-187.