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[n]	S. Tak?ícs, F. Szelecs?®nyi, F. T?írk?ínyi, A. Hermanne, M. Sonck, and J. van Hoyweghen, “The Use of Cross Section Data for Monitoring Charged Particle Beam Parameters”, in Proc. Cyclotrons'98, Caen, France, Jun. 1998, paper B-26, pp. 246-249. 

For LaTeX

%\cite{Tak?ícs:Cyclotrons98-B-26} \bibitem{Tak?ícs:Cyclotrons98-B-26} S. Tak?ícs, F. Szelecs?®nyi, F. T?írk?ínyi, A. Hermanne, M. Sonck, and J. van Hoyweghen, \textquotedblleft{The Use of Cross Section Data for Monitoring Charged Particle Beam Parameters}\textquotedblright, in \emph{Proc. Cyclotrons’98}, Caen, France, Jun. 1998, paper B--26, pp. 246--249.

For BibTeX

@inproceedings{tak?ícs:cyclotrons98-b-26, author = {S. Tak?ícs and F. Szelecs?®nyi and F. T?írk?ínyi and A. Hermanne and M. Sonck and J. van Hoyweghen}, title = {{The Use of Cross Section Data for Monitoring Charged Particle Beam Parameters}}, booktitle = {Proc. Cyclotrons'98}, pages = {246--249}, paper = {B-26}, venue = {Caen, France, Jun. 1998}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/c98/papers/B-26.pdf}, language = {english} }

References

• S. Tak?ícs, F. Szelecs?®nyi, F. T?írk?ínyi, A. Hermanne, M. Sonck, and J. van Hoyweghen, “The Use of Cross Section Data for Monitoring Charged Particle Beam Parameters”, in Proc. 15th Int. Cyclotron Conf. and Their Applications (Cyclotrons'98), Caen, France, Jun. 1998, paper B-26, pp. 246-249.