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[n]	F. Albert et al., “Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry”, in Proc. SRF'97, Padova, Italy, Oct. 1997, paper SRF97D09, pp. 873-880. 

[n]	W. Koprek, B. Keil, and G. Marinkovic, “Overview of Applications and Synergies of a Generic FPGA-Based Beam Diagnostics Electronics Platform at SwissFEL”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 165-169. doi:10.18429/JACoW-IBIC2015-MOPB050

For LaTeX

%\cite{Albert:SRF97-SRF97D09} \bibitem{Albert:SRF97-SRF97D09} F. Albert \emph{et al.}, \textquotedblleft{Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry}\textquotedblright, in \emph{Proc. SRF’97}, Padova, Italy, Oct. 1997, paper SRF97D09, pp. 873--880. %\cite{Koprek:IBIC15-MOPB050} \bibitem{Koprek:IBIC15-MOPB050} W. Koprek, B. Keil, and G. Marinkovic, \textquotedblleft{Overview of Applications and Synergies of a Generic FPGA-Based Beam Diagnostics Electronics Platform at SwissFEL}\textquotedblright, in \emph{Proc. IBIC’15}, Melbourne, Australia, Sep. 2015, pp. 165--169. \doi{10.18429/JACoW-IBIC2015-MOPB050}

For BibTeX

@inproceedings{albert:srf97-srf97d09, author = {F. Albert and others}, title = {{Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry}}, booktitle = {Proc. SRF'97}, pages = {873--880}, paper = {SRF97D09}, venue = {Padova, Italy, Oct. 1997}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF97/papers/SRF97D09.pdf}, language = {english} } @inproceedings{koprek:ibic15-mopb050, author = {W. Koprek and B. Keil and G. Marinkovic}, title = {{Overview of Applications and Synergies of a Generic FPGA-Based Beam Diagnostics Electronics Platform at SwissFEL}}, booktitle = {Proc. IBIC'15}, pages = {165--169}, paper = {MOPB050}, venue = {Melbourne, Australia, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2015-MOPB050}, url = {https://jacow.org/IBIC2015/papers/MOPB050.pdf}, language = {english} }

References

• F. Albert et al., “Niobium Surface Defect Induced by Strong Electric Field Probed by Soft X-Ray Laser Interferometry”, in Proc. 8th Int. Conf. RF Superconductivity (SRF'97), Padova, Italy, Oct. 1997, paper SRF97D09, pp. 873-880.
• W. Koprek, B. Keil, and G. Marinkovic, “Overview of Applications and Synergies of a Generic FPGA-Based Beam Diagnostics Electronics Platform at SwissFEL”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 165-169.