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[n]	A. Tron, “Space Charge Effect in Secondary Electron Monitors”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 8P062, pp. 2247-2249. 
[n]	P. Krejcik, D. Bernstein, A. Gromme, D. Ohman, and N. Spencer, “Analysis of Uptime Efficiency of the SLC as Measured by Pulse Accounting”, in Proc. PAC'91, San Francisco, CA, USA, May 1991, pp. 836-839. 
[n]	T. E. May, R. A. Bosch, and R. L. Julian, “Infrared Edge Radiation Beamline at Aladdin”, in Proc. PAC'99, New York, NY, USA, Mar. 1999, paper WEP53, pp. 2394-2396. 
[n]	M. Ebbeni, H. Tarawneh, and A. Thiel, “Status of Insertion Device Measurement Systems at MAX IV Laboratory”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 4047-4049. doi:10.18429/JACoW-IPAC2016-THPOW046
[n]	N. Rouviere, “RF Liners for High Brilliance Beam”, in Proc. EPAC'96, Sitges, Spain, Jun. 1996, paper WEP036G, pp. 1036-1038. 
[n]	S. Soykarci, D. L??tzenkirchen-Hecht, V. Porshyn, and P. Serbun, “Influence of Argon-Ion Irradiation on Field Emission from Polycrystalline Cu and Large-Grain NB Surfaces”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 2384-2386. doi:10.18429/JACoW-IPAC2018-WEPMF009
[n]	A. Thiel, M. Ebbeni, and H. Tarawneh, “Apple II Insertion Devices Made at MAXIV”, in Proc. MEDSI'18, Paris, France, Jun. 2018, pp. 6-10. doi:10.18429/JACoW-MEDSI2018-TUOPMA04

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