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[n]	C. A. Cooper et al., “Recent Developments in Electropolishing and Tumbling R&D at Fermilab”, in Proc. SRF'09, Berlin, Germany, Sep. 2009, paper THPPO076, pp. 806-810. 

[n]	M. W. Wang et al., “Design and Test Results of a Double-Slit Emittance Meter at XiPAF”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 509-511. doi:10.18429/JACoW-IBIC2018-WEPC09

For LaTeX

%\cite{Cooper:SRF09-THPPO076} \bibitem{Cooper:SRF09-THPPO076} C. A. Cooper \emph{et al.}, \textquotedblleft{Recent Developments in Electropolishing and Tumbling R&D at Fermilab}\textquotedblright, in \emph{Proc. SRF’09}, Berlin, Germany, Sep. 2009, paper THPPO076, pp. 806--810. %\cite{Wang:IBIC18-WEPC09} \bibitem{Wang:IBIC18-WEPC09} M. W. Wang \emph{et al.}, \textquotedblleft{Design and Test Results of a Double-Slit Emittance Meter at XiPAF}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 509--511. \url{doi:10.18429/JACoW-IBIC2018-WEPC09}

For BibTeX

@inproceedings{cooper:srf09-thppo076, author = {C. A. Cooper and others}, title = {{Recent Developments in Electropolishing and Tumbling R&D at Fermilab}}, booktitle = {Proc. SRF'09}, pages = {806--810}, paper = {THPPO076}, venue = {Berlin, Germany, Sep. 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2009/papers/THPPO076.pdf}, language = {english} } @inproceedings{wang:ibic18-wepc09, author = {M. W. Wang and others}, title = {{Design and Test Results of a Double-Slit Emittance Meter at XiPAF}}, booktitle = {Proc. IBIC'18}, pages = {509--511}, paper = {WEPC09}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPC09}, url = {https://jacow.org/IBIC2018/papers/WEPC09.pdf}, language = {english} }

References

• C. A. Cooper et al., “Recent Developments in Electropolishing and Tumbling R&D at Fermilab”, in Proc. 14th Int. Conf. RF Superconductivity (SRF'09), Berlin, Germany, Sep. 2009, paper THPPO076, pp. 806-810.
• M. W. Wang et al., “Design and Test Results of a Double-Slit Emittance Meter at XiPAF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 509-511.