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[n]	M. Camarda et al., “Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 665-668. doi:10.18429/JACoW-IBIC2019-THAO02

For LaTeX

%\cite{Camarda:IBIC19-THAO02} \bibitem{Camarda:IBIC19-THAO02} M. Camarda \emph{et al.}, \textquotedblleft{Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring}\textquotedblright, in \emph{Proc. IBIC’19}, Malmö, Sweden, Sep. 2019, pp. 665--668. \url{doi:10.18429/JACoW-IBIC2019-THAO02}

For BibTeX

@inproceedings{camarda:ibic19-thao02, author = {M. Camarda and others}, title = {{Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring}}, booktitle = {Proc. IBIC'19}, pages = {665--668}, paper = {THAO02}, venue = {Malmö, Sweden, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2019-THAO02}, url = {https://jacow.org/ibic2019/papers/THAO02.pdf}, language = {english} }

References

• M. Camarda et al., “Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 665-668.