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[n] Y. Kim and C. Kim, “Error tolerances for a 4 GeV fourth-generation synchrotron light source”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper WEPS125, unpublished.
[n] J. W. Storey et al., “Development of an Ionization Profile Monitor Based on a Pixel Detector for the CERN Proton Synchrotron”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 470-473. doi:10.18429/JACoW-IBIC2015-TUPB059
[n] S. Fahlstr?Âm, C. Gerth, M. Hamberg, N. M. Lockmann, and B. Steffen, “NIR Spectrometer for Bunch-Resolved, Non-Destructive Studies of Microbunching at European XFEL”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 392-395. doi:10.18429/JACoW-FEL2019-WEP035
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References
- Y. Kim and C. Kim, “Error tolerances for a 4 GeV fourth-generation synchrotron light source”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper WEPS125, this conference.
- J. W. Storey et al., “Development of an Ionization Profile Monitor Based on a Pixel Detector for the CERN Proton Synchrotron”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 470-473.
- S. Fahlstr?Âm, C. Gerth, M. Hamberg, N. M. Lockmann, and B. Steffen, “NIR Spectrometer for Bunch-Resolved, Non-Destructive Studies of Microbunching at European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 392-395.
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