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[n]	D. A. Walsh, S. P. Jamison, E. W. Snedden, and T. Lefevre, “A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 752-755. doi:10.18429/JACoW-IBIC2016-WEPG49

For LaTeX

%\cite{Walsh:IBIC16-WEPG49} \bibitem{Walsh:IBIC16-WEPG49} D. A. Walsh, S. P. Jamison, E. W. Snedden, and T. Lefevre, \textquotedblleft{A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition}\textquotedblright, in \emph{Proc. IBIC’16}, Barcelona, Spain, Sep. 2016, pp. 752--755. \url{doi:10.18429/JACoW-IBIC2016-WEPG49}

For BibTeX

@inproceedings{walsh:ibic16-wepg49, author = {D. A. Walsh and S. P. Jamison and E. W. Snedden and T. Lefevre}, title = {{A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition}}, booktitle = {Proc. IBIC'16}, pages = {752--755}, paper = {WEPG49}, venue = {Barcelona, Spain, Sep. 2016}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2016-WEPG49}, url = {https://jacow.org/ibic2016/papers/WEPG49.pdf}, language = {english} }

References

• D. A. Walsh, S. P. Jamison, E. W. Snedden, and T. Lefevre, “A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 752-755.