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[n] V. Senaj, T. Kramer, M. Sack, and A. A. del Barrio Monta???®s, “Sub-Nanosecond Switching of HV SiC MOS Transistors for Impact Ionisation Triggering”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 4454-4456. doi:10.18429/JACoW-IPAC2021-THPAB340
[n] M. A. Green and S. Chouhan, “Cooling-down and Cooling of Superconducting Magnets at 4.5K with Very Little Liquid Helium using Coolers”, in Proc. IPAC'17, Copenhagen, Denmark, May 2017, pp. 3606-3608. doi:10.18429/JACoW-IPAC2017-WEPVA143
[n] D. A. Walsh, S. P. Jamison, E. W. Snedden, and T. Lefevre, “A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 752-755. doi:10.18429/JACoW-IBIC2016-WEPG49
[n] Y. M. Saveliev, S. P. Jamison, L. B. Jones, and B. D. Muratori, “Characterisation of Electron Bunches from ALICE (ERLP) DC Photoinjector Gun at Two Different Laser Pulse Lengths”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper MOPC063, pp. 211-213.
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References
- V. Senaj, T. Kramer, M. Sack, and A. A. del Barrio Monta???®s, “Sub-Nanosecond Switching of HV SiC MOS Transistors for Impact Ionisation Triggering”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 4454-4456.
- M. A. Green and S. Chouhan, “Cooling-down and Cooling of Superconducting Magnets at 4.5K with Very Little Liquid Helium using Coolers”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 3606-3608.
- D. A. Walsh, S. P. Jamison, E. W. Snedden, and T. Lefevre, “A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 752-755.
- Y. M. Saveliev, S. P. Jamison, L. B. Jones, and B. D. Muratori, “Characterisation of Electron Bunches from ALICE (ERLP) DC Photoinjector Gun at Two Different Laser Pulse Lengths”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper MOPC063, pp. 211-213.
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