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[n]	H. Schlarb et al., “Next Generation Synchronization System for the VUV-FEL at DESY”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper MOPP036, pp. XX-XX. 

[n]	S. S. Cao, J. Chen, Y. B. Leng, and R. X. Yuan, “Beam Arrival Time Measurement at SXFEL”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 193-195. doi:10.18429/JACoW-IBIC2017-TUPCC18

For LaTeX

%\cite{Schlarb:FEL05-MOPP036} \bibitem{Schlarb:FEL05-MOPP036} H. Schlarb \emph{et al.}, \textquotedblleft{Next Generation Synchronization System for the VUV-FEL at DESY}\textquotedblright, in \emph{Proc. FEL’05}, Palo Alto, CA, USA, Aug. 2005, paper MOPP036, pp. XX--XX. %\cite{Cao:IBIC17-TUPCC18} \bibitem{Cao:IBIC17-TUPCC18} S. S. Cao, J. Chen, Y. B. Leng, and R. X. Yuan, \textquotedblleft{Beam Arrival Time Measurement at SXFEL}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 193--195. \doi{10.18429/JACoW-IBIC2017-TUPCC18}

For BibTeX

@inproceedings{schlarb:fel05-mopp036, author = {H. Schlarb and others}, title = {{Next Generation Synchronization System for the VUV-FEL at DESY}}, booktitle = {Proc. FEL'05}, paper = {MOPP036}, venue = {Palo Alto, CA, USA, Aug. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/f05/papers/MOPP036.pdf}, language = {english} } @inproceedings{cao:ibic17-tupcc18, author = {S. S. Cao and J. Chen and Y. B. Leng and R. X. Yuan}, title = {{Beam Arrival Time Measurement at SXFEL}}, booktitle = {Proc. IBIC'17}, pages = {193--195}, paper = {TUPCC18}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-TUPCC18}, url = {https://jacow.org/ibic2017/papers/TUPCC18.pdf}, language = {english} }

References

• H. Schlarb et al., “Next Generation Synchronization System for the VUV-FEL at DESY”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper MOPP036, pp. XX-XX.
• S. S. Cao, J. Chen, Y. B. Leng, and R. X. Yuan, “Beam Arrival Time Measurement at SXFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 193-195.