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[n]	J. Zeigler, R. Carcagno, and M. Weichold, “Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 1537-1540. 

[n]	M. Tobiyama et al., “Bunch by Bunch Feedback Systems for J-PARC MR”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper WEPEB036, pp. 2767-2769. 

[n]	P. Junphong, Mr. Ano, S. Rattanarin, Dr. Suwannakachorn, A. Takahashi, and T. Vilaithong, “System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPCH126, pp. 3095-3097. 

[n]	P. Junphong et al., “The System of Nanosecond 280-keV-He+ Pulsed Beam”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper FPAE076, pp. 3982-3984. 

[n]	S. Bhattacharyya, R. K. Yedavalli, J. S. Kerby, and A. Mukherjee, “Reliability Modeling Method for Proton Accelerator”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper THPPR031, pp. 4035-4037. 

For LaTeX

%\cite{Zeigler:PAC87} \bibitem{Zeigler:PAC87} J. Zeigler, R. Carcagno, and M. Weichold, \textquotedblleft{Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature}\textquotedblright, in \emph{Proc. PAC’87}, Washington D.C., USA, Mar. 1987, pp. 1537--1540. %\cite{Tobiyama:IPAC10-WEPEB036} \bibitem{Tobiyama:IPAC10-WEPEB036} M. Tobiyama \emph{et al.}, \textquotedblleft{Bunch by Bunch Feedback Systems for J-PARC MR}\textquotedblright, in \emph{Proc. IPAC’10}, Kyoto, Japan, May 2010, paper WEPEB036, pp. 2767--2769. %\cite{Junphong:EPAC06-THPCH126} \bibitem{Junphong:EPAC06-THPCH126} P. Junphong, Mr. Ano, S. Rattanarin, Dr. Suwannakachorn, A. Takahashi, and T. Vilaithong, \textquotedblleft{System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials}\textquotedblright, in \emph{Proc. EPAC’06}, Edinburgh, UK, Jun. 2006, paper THPCH126, pp. 3095--3097. %\cite{Junphong:PAC05-FPAE076} \bibitem{Junphong:PAC05-FPAE076} P. Junphong \emph{et al.}, \textquotedblleft{The System of Nanosecond 280-keV-He+ Pulsed Beam}\textquotedblright, in \emph{Proc. PAC’05}, Knoxville, TN, USA, May 2005, paper FPAE076, pp. 3982--3984. %\cite{Bhattacharyya:IPAC12-THPPR031} \bibitem{Bhattacharyya:IPAC12-THPPR031} S. Bhattacharyya, R. K. Yedavalli, J. S. Kerby, and A. Mukherjee, \textquotedblleft{Reliability Modeling Method for Proton Accelerator}\textquotedblright, in \emph{Proc. IPAC’12}, New Orleans, LA, USA, May 2012, paper THPPR031, pp. 4035--4037.

For BibTeX

@inproceedings{zeigler:pac87, author = {J. Zeigler and R. Carcagno and M. Weichold}, title = {{Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature}}, booktitle = {Proc. PAC'87}, pages = {1537--1540}, paper = {}, venue = {Washington D.C., USA, Mar. 1987}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{tobiyama:ipac10-wepeb036, author = {M. Tobiyama and others}, title = {{Bunch by Bunch Feedback Systems for J-PARC MR}}, booktitle = {Proc. IPAC'10}, pages = {2767--2769}, paper = {WEPEB036}, venue = {Kyoto, Japan, May 2010}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {http://accelconf.web.cern.ch/IPAC10/papers/WEPEB036.pdf}, language = {english} } @inproceedings{junphong:epac06-thpch126, author = {P. Junphong and Mr. Ano and S. Rattanarin and Dr. Suwannakachorn and A. Takahashi and T. Vilaithong}, title = {{System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials}}, booktitle = {Proc. EPAC'06}, pages = {3095--3097}, paper = {THPCH126}, venue = {Edinburgh, UK}, series = {European Particle Accelerator Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2006}, language = {english} } @inproceedings{junphong:pac05-fpae076, author = {P. Junphong and others}, title = {{The System of Nanosecond 280-keV-He+ Pulsed Beam}}, booktitle = {Proc. PAC'05}, pages = {3982--3984}, paper = {FPAE076}, venue = {Knoxville, TN, USA, May 2005}, series = {Particle Accelerator Conference}, number = {21}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p05/papers/FPAE076.pdf}, language = {english} } @inproceedings{bhattacharyya:ipac12-thppr031, author = {S. Bhattacharyya and R. K. Yedavalli and J. S. Kerby and A. Mukherjee}, title = {{Reliability Modeling Method for Proton Accelerator}}, booktitle = {Proc. IPAC'12}, pages = {4035--4037}, paper = {THPPR031}, venue = {New Orleans, LA, USA, May 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2012/papers/THPPR031.pdf}, language = {english} }

References

• J. Zeigler, R. Carcagno, and M. Weichold, “Experimental Measurements of Radiation Damage to Power Diodes at Cryogenic Temperature”, in Proc. 12th Particle Accelerator Conf. (PAC'87), Washington D.C., USA, Mar. 1987, pp. 1537-1540.
• M. Tobiyama et al., “Bunch by Bunch Feedback Systems for J-PARC MR”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper WEPEB036, pp. 2767-2769.
• P. Junphong, Mr. Ano, S. Rattanarin, Dr. Suwannakachorn, A. Takahashi, and T. Vilaithong, “System Development of a Time-of-flight Spectrometer for Surface Analysis of Materials”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THPCH126, pp. 3095-3097.
• P. Junphong et al., “The System of Nanosecond 280-keV-He+ Pulsed Beam”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper FPAE076, pp. 3982-3984.
• S. Bhattacharyya, R. K. Yedavalli, J. S. Kerby, and A. Mukherjee, “Reliability Modeling Method for Proton Accelerator”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper THPPR031, pp. 4035-4037.