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[n]	David Sagan, Yuri Orlov, “Ion Trapping in the CESR B-factory”, in Proc. PAC'91, San Francisco, CA, USA, May 1991, pp. 1839-1842. 

[n]	H. J. Choi, M. S. Chae, J. H. Hong, C. Kim, D. T. Kim, and S. J. Park, “Introduction to Beam Diagnostics Components for PAL-ITF”, in Proc. IPAC'13, Shanghai, China, May 2013, paper MOPME060, pp. 610-612. 

For LaTeX

%\cite{David Sagan:PAC91} \bibitem{David Sagan:PAC91} David Sagan, Yuri Orlov, \textquotedblleft{Ion Trapping in the CESR B-factory}\textquotedblright, in \emph{Proc. PAC’91}, San Francisco, CA, USA, May 1991, pp. 1839--1842. %\cite{Choi:IPAC13-MOPME060} \bibitem{Choi:IPAC13-MOPME060} H. J. Choi, M. S. Chae, J. H. Hong, C. Kim, D. T. Kim, and S. J. Park, \textquotedblleft{Introduction to Beam Diagnostics Components for PAL-ITF}\textquotedblright, in \emph{Proc. IPAC’13}, Shanghai, China, May 2013, paper MOPME060, pp. 610--612.

For BibTeX

@inproceedings{david sagan:pac91, author = {David Sagan and Yuri Orlov}, title = {{Ion Trapping in the CESR B-factory}}, booktitle = {Proc. PAC'91}, pages = {1839--1842}, paper = {}, venue = {San Francisco, CA, USA, May 1991}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{choi:ipac13-mopme060, author = {H. J. Choi and M. S. Chae and J. H. Hong and C. Kim and D. T. Kim and S. J. Park}, title = {{Introduction to Beam Diagnostics Components for PAL-ITF}}, booktitle = {Proc. IPAC'13}, pages = {610--612}, paper = {MOPME060}, venue = {Shanghai, China, May 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2013/papers/MOPME060.pdf}, language = {english} }

References

• David Sagan, Yuri Orlov, “Ion Trapping in the CESR B-factory”, in Proc. 14th Particle Accelerator Conf. (PAC'91), San Francisco, CA, USA, May 1991, pp. 1839-1842.
• H. J. Choi, M. S. Chae, J. H. Hong, C. Kim, D. T. Kim, and S. J. Park, “Introduction to Beam Diagnostics Components for PAL-ITF”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPME060, pp. 610-612.