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[n]	P. Xu et al., “Automatic measurement of the stray magnetic field in the RCS locations of RHIC by using the SPOT robot”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 957-961. doi:10.18429/JACoW-NAPAC2025-THP009

[n]	C.-J. Jing et al., “Observation of Wakefields in a Beam-Driven Photonic Band Gap Accelerating Structure”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper THPD066, pp. 4431-4433. 

[n]	P. Xu, N. T. Wright, T. R. Bieler, and C. Compton, “Temperature Excursions in Nb Sheets With Imbedded Delamination Cracks”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper MOPB007, pp. 82-85. 

[n]	M. Goldstein et al., “FEL Applications in EUV Lithography”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper THOA002, pp. XX-XX. 

For LaTeX

%\cite{Xu:NAPAC25-THP009} \bibitem{Xu:NAPAC25-THP009} P. Xu \emph{et al.}, \textquotedblleft{Automatic measurement of the stray magnetic field in the RCS locations of RHIC by using the SPOT robot}\textquotedblright, in \emph{Proc. NAPAC’25}, Sacramento, California, USA, Aug. 2025, pp. 957--961. \doi{10.18429/JACoW-NAPAC2025-THP009} %\cite{C.-J:IPAC10-THPD066} \bibitem{C.-J:IPAC10-THPD066} C.-J. Jing \emph{et al.}, \textquotedblleft{Observation of Wakefields in a Beam-Driven Photonic Band Gap Accelerating Structure}\textquotedblright, in \emph{Proc. IPAC’10}, Kyoto, Japan, May 2010, paper THPD066, pp. 4431--4433. %\cite{PXu:SRF15-MOPB007} \bibitem{PXu:SRF15-MOPB007} P. Xu, N. T. Wright, T. R. Bieler, and C. Compton, \textquotedblleft{Temperature Excursions in Nb Sheets With Imbedded Delamination Cracks}\textquotedblright, in \emph{Proc. SRF’15}, Whistler, Canada, Sep. 2015, paper MOPB007, pp. 82--85. %\cite{Goldstein:FEL05-THOA002} \bibitem{Goldstein:FEL05-THOA002} M. Goldstein \emph{et al.}, \textquotedblleft{FEL Applications in EUV Lithography}\textquotedblright, in \emph{Proc. FEL’05}, Palo Alto, CA, USA, Aug. 2005, paper THOA002, pp. XX--XX.

For BibTeX

@inproceedings{xu:napac25-thp009, author = {P. Xu and others}, title = {{Automatic measurement of the stray magnetic field in the RCS locations of RHIC by using the SPOT robot}}, booktitle = {Proc. NAPAC'25}, pages = {957--961}, paper = {THP009}, venue = {Sacramento, California, USA}, series = {North American Particle Accelerator Conference}, number = {6}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-7000}, isbn = {978-3-95-450261-5}, doi = {10.18429/JACoW-NAPAC2025-THP009}, language = {english} } @inproceedings{c.-j:ipac10-thpd066, author = {C.-J. Jing and others}, title = {{Observation of Wakefields in a Beam-Driven Photonic Band Gap Accelerating Structure}}, booktitle = {Proc. IPAC'10}, pages = {4431--4433}, paper = {THPD066}, venue = {Kyoto, Japan, May 2010}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {http://accelconf.web.cern.ch/IPAC10/papers/THPD066.pdf}, language = {english} } @inproceedings{pxu:srf15-mopb007, author = {P. Xu and N. T. Wright and T. R. Bieler and C. Compton}, title = {{Temperature Excursions in Nb Sheets With Imbedded Delamination Cracks}}, booktitle = {Proc. SRF'15}, pages = {82--85}, paper = {MOPB007}, venue = {Whistler, Canada, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2015/papers/MOPB007.pdf}, language = {english} } @inproceedings{goldstein:fel05-thoa002, author = {M. Goldstein and others}, title = {{FEL Applications in EUV Lithography}}, booktitle = {Proc. FEL'05}, paper = {THOA002}, venue = {Palo Alto, CA, USA, Aug. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/f05/papers/THOA002.pdf}, language = {english} }

References

• P. Xu et al., “Automatic measurement of the stray magnetic field in the RCS locations of RHIC by using the SPOT robot”, in Proc. 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, pp. 957-961.
• C.-J. Jing et al., “Observation of Wakefields in a Beam-Driven Photonic Band Gap Accelerating Structure”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper THPD066, pp. 4431-4433.
• P. Xu, N. T. Wright, T. R. Bieler, and C. Compton, “Temperature Excursions in Nb Sheets With Imbedded Delamination Cracks”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper MOPB007, pp. 82-85.
• M. Goldstein et al., “FEL Applications in EUV Lithography”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THOA002, pp. XX-XX.