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[n]	P. S. Yoon, C. L. Bohn, and W. Chou, “Simulations of Error-Induced Beam Degradation in Fermilab's Booster Synchrotron”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper TPAT015, pp. 1458-1460. 

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