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[n]	C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 302-304. doi:10.18429/JACoW-CYCLOTRONS2019-THB04

For LaTeX

%\cite{Thiebaux:Cyclotrons19-THB04} \bibitem{Thiebaux:Cyclotrons19-THB04} C. Thiebaux \emph{et al.}, \textquotedblleft{Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}\textquotedblright, in \emph{Proc. Cyclotrons’19}, Cape Town, South Africa, Sep. 2019, pp. 302--304. \url{doi:10.18429/JACoW-CYCLOTRONS2019-THB04}

For BibTeX

@inproceedings{thiebaux:cyclotrons19-thb04, author = {C. Thiebaux and others}, title = {{Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams}}, booktitle = {Proc. Cyclotrons'19}, pages = {302--304}, paper = {THB04}, venue = {Cape Town, South Africa, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-CYCLOTRONS2019-THB04}, url = {https://jacow.org/cyclotrons2019/papers/THB04.pdf}, language = {english} }

References

• C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19), Cape Town, South Africa, Sep. 2019, pp. 302-304.