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[n]	I. Hofmann, “Challenges in Benchmarking of Simulation Codes against Real High Intensity Accelerators”, in Proc. HB'12, Beijing, China, Sep. 2012, paper MOI1C02, pp. 30-35. 
[n]	T. E. Oseroff et al., “Performance of Samples With Novel SRF Materials and Growth Techniques”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 2475-2478. doi:10.18429/JACoW-IPAC2018-WEPMF047
[n]	H. H. Refsum, B. Dehning, and J. Koopman, “Simulation of an Electron Source Based Calibrating System for an Ionisation Profile Monitor”, in Proc. DIPAC'05, Lyon, France, Jun. 2005, paper POT008, pp. XX-XX. 
[n]	R. D. Porter et al., “High-performance Thin-film Niobium Produced via Chemical Vapor Deposition (CVD)”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 674-680. doi:10.18429/JACoW-SRF2017-WEXA03
[n]	N. K. Kuksanov et al., “AUTOMATED COMPLEX FOR E-B TREATMENT OF CABLE AND WIRE INSULATION”, in Proc. RuPAC'08, Zvenigorod, Russia, Sep.-Oct. 2008, paper THCAU01, pp. XX-XX. 

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