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[n]	S. Eylon, E. Henestroza, M. Vella, S. S. Yu, and C. Ekdahl, “Electron Beam, 3.5MV, 2kA Injector Diode Diagnostics for the DARHT Facility”, in Proc. PAC'01, Chicago, IL, USA, Jun. 2001, paper WPAH126, pp. 2380-2382. 

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