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[n]	G. E. Leyh, “A Critical Analysis of IGBT Geometries, with the Intention of Mitigating Undesirable Destruction Caused by Fault Scenarios of an Adverse Nature”, in Proc. PAC'03, Portland, OR, USA, May 2003, paper TPAE041, pp. 1174-1176. 
[n]	M. J. Spencer, M. J. Boland, R. T. Dowd, G. LeBlanc, and Y. E. Tan, “Tune and Lifetime Studies at the Australian Synchrotron”, in Proc. APAC'07, Indore, India, Jan.-Feb. 2007, paper WEPMA058, pp. 401-403. 

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