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[n]	A. S. Gogolev, A. P. Potylitsyn, A. M. Taratin, “Method of Crystal Deflector Monitoring”, in Proc. RuPAC'06, Novosibirsk, Russia, Sep. 2006, paper THDO03, pp. XX-XX. 

[n]	A. S. Gogolev, S. R. Uglov, and A. M. Taratin, “Method of State and Alignment Monitoring for Crystal Deflectors of Relativistic Ions”, in Proc. RuPAC'12, Saint Petersburg, Russia, Sep. 2012, paper FRAOR02, pp. 200-202. 

[n]	S. B. Leith et al., “The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 86. doi:10.18429/JACoW-SRF2021-SUPFDV012

[n]	R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, “Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper MOPC20, pp. 97-100. 

For LaTeX

%\cite{Gogolev:RuPAC06-THDO03} \bibitem{Gogolev:RuPAC06-THDO03} A. S. Gogolev, A. P. Potylitsyn, A. M. Taratin, \textquotedblleft{Method of Crystal Deflector Monitoring}\textquotedblright, in \emph{Proc. RuPAC’06}, Novosibirsk, Russia, Sep. 2006, paper THDO03, pp. XX--XX. %\cite{Gogolev:RuPAC12-FRAOR02} \bibitem{Gogolev:RuPAC12-FRAOR02} A. S. Gogolev, S. R. Uglov, and A. M. Taratin, \textquotedblleft{Method of State and Alignment Monitoring for Crystal Deflectors of Relativistic Ions}\textquotedblright, in \emph{Proc. RuPAC’12}, Saint Petersburg, Russia, Sep. 2012, paper FRAOR02, pp. 200--202. %\cite{Leith:SRF21-SUPFDV012} \bibitem{Leith:SRF21-SUPFDV012} S. B. Leith \emph{et al.}, \textquotedblleft{The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 86. \doi{10.18429/JACoW-SRF2021-SUPFDV012} %\cite{Steinhagen:IBIC13-MOPC20} \bibitem{Steinhagen:IBIC13-MOPC20} R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, \textquotedblleft{Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics}\textquotedblright, in \emph{Proc. IBIC’13}, Oxford, UK, Sep. 2013, paper MOPC20, pp. 97--100.

For BibTeX

@inproceedings{gogolev:rupac06-thdo03, author = {A. S. Gogolev and A. P. Potylitsyn and A. M. Taratin}, title = {{Method of Crystal Deflector Monitoring}}, booktitle = {Proc. RuPAC'06}, paper = {THDO03}, venue = {Novosibirsk, Russia, Sep. 2006}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/r06/papers/THDO03.pdf}, language = {english} } @inproceedings{gogolev:rupac12-fraor02, author = {A. S. Gogolev and S. R. Uglov and A. M. Taratin}, title = {{Method of State and Alignment Monitoring for Crystal Deflectors of Relativistic Ions}}, booktitle = {Proc. RuPAC'12}, pages = {200--202}, paper = {FRAOR02}, venue = {Saint Petersburg, Russia, Sep. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/rupac2012/papers/FRAOR02.pdf}, language = {english} } @inproceedings{leith:srf21-supfdv012, author = {S. B. Leith and others}, title = {{The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications}}, booktitle = {Proc. SRF'21}, pages = {86}, paper = {SUPFDV012}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-SUPFDV012}, url = {https://jacow.org/srf2021/papers/SUPFDV012.pdf}, language = {english} } @inproceedings{steinhagen:ibic13-mopc20, author = {R. J. Steinhagen and M. J. Boland and T. G. Lucas and R. P. Rassool and T. M. Mitsuhashi}, title = {{Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics}}, booktitle = {Proc. IBIC'13}, pages = {97--100}, paper = {MOPC20}, venue = {Oxford, UK, Sep. 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IBIC2013/papers/MOPC20.pdf}, language = {english} }

References

• A. S. Gogolev, A. P. Potylitsyn, A. M. Taratin, “Method of Crystal Deflector Monitoring”, in Proc. 20th Russian Particle Accelerator Conf. on Charged Particle Accelerators (RuPAC'06), Novosibirsk, Russia, Sep. 2006, paper THDO03, pp. XX-XX.
• A. S. Gogolev, S. R. Uglov, and A. M. Taratin, “Method of State and Alignment Monitoring for Crystal Deflectors of Relativistic Ions”, in Proc. 23rd Russian Particle Accelerator Conf. (RuPAC'12), Saint Petersburg, Russia, Sep. 2012, paper FRAOR02, pp. 200-202.
• S. B. Leith et al., “The Development of HiPIMS Multilayer SIS Film Coatings on Copper for SRF Applications”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 86.
• R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, “Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPC20, pp. 97-100.