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[n]	D. K. Liu and K. R. Ye, “Improvement of Beam Diagnosis”, in Proc. LINAC'94, Tsukuba, Japan, Aug. 1994, paper TH-73, pp. 875-877. 

[n]	W. L. Huang, F. Li, L. Ma, S. Wang, and T. G. Xu, “Beam Charge Measurement and System Calibration in CSNS”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 122-125. doi:10.18429/JACoW-IBIC2018-MOPC04

For LaTeX

%\cite{Liu:LINAC94-TH-73} \bibitem{Liu:LINAC94-TH-73} D. K. Liu and K. R. Ye, \textquotedblleft{Improvement of Beam Diagnosis}\textquotedblright, in \emph{Proc. LINAC’94}, Tsukuba, Japan, Aug. 1994, paper TH--73, pp. 875--877. %\cite{Huang:IBIC18-MOPC04} \bibitem{Huang:IBIC18-MOPC04} W. L. Huang, F. Li, L. Ma, S. Wang, and T. G. Xu, \textquotedblleft{Beam Charge Measurement and System Calibration in CSNS}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 122--125. \doi{10.18429/JACoW-IBIC2018-MOPC04}

For BibTeX

@inproceedings{liu:linac94-th-73, author = {D. K. Liu and K. R. Ye}, title = {{Improvement of Beam Diagnosis}}, booktitle = {Proc. LINAC'94}, pages = {875--877}, paper = {TH-73}, venue = {Tsukuba, Japan, Aug. 1994}, series = {Linear Accelerator Conference}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://accelconf.web.cern.ch/l94/papers/TH-73.pdf}, language = {english} } @inproceedings{huang:ibic18-mopc04, author = {W. L. Huang and F. Li and L. Ma and S. Wang and T. G. Xu}, title = {{Beam Charge Measurement and System Calibration in CSNS}}, booktitle = {Proc. IBIC'18}, pages = {122--125}, paper = {MOPC04}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-MOPC04}, url = {https://jacow.org/IBIC2018/papers/MOPC04.pdf}, language = {english} }

References

• D. K. Liu and K. R. Ye, “Improvement of Beam Diagnosis”, in Proc. 1994 Linear Accelerator Conf. (LINAC'94), Tsukuba, Japan, Aug. 1994, paper TH-73, pp. 875-877.
• W. L. Huang, F. Li, L. Ma, S. Wang, and T. G. Xu, “Beam Charge Measurement and System Calibration in CSNS”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 122-125.