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[n]	S. Sampayan, J. Weir, and R. Richardson, “Elliptical X-Ray Spot Measurement”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper MOC07, pp. 161-163. 
[n]	Y. T. Ding, P. Emma, Z. Huang, and V. Kumar, “Optical Klystron Enhancement to SASE X-Ray FELs”, in Proc. FEL'06, Berlin, Germany, Aug.-Sep. 2006, paper MOBAU04, pp. 29-32. 

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