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[n]	D. Seal et al., “A LHe-free test facility for thin film SRF cavity testing”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 654-660. doi:10.18429/JACoW-SRF2025-THP24

For LaTeX

%\cite{Seal:SRF25-THP24} \bibitem{Seal:SRF25-THP24} D. Seal \emph{et al.}, \textquotedblleft{A LHe-free test facility for thin film SRF cavity testing}\textquotedblright, in \emph{Proc. SRF’25}, Tokyo, Japan, Sep. 2025, pp. 654--660. \doi{10.18429/JACoW-SRF2025-THP24}

For BibTeX

@inproceedings{seal:srf25-thp24, author = {D. Seal and others}, title = {{A LHe-free test facility for thin film SRF cavity testing}}, booktitle = {Proc. SRF'25}, pages = {654--660}, paper = {THP24}, venue = {Tokyo, Japan}, series = {Int. Conf. on RF Superconductivity}, number = {22}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2026}, issn = {2673-5504}, isbn = {978-3-95-450256-1}, doi = {10.18429/JACoW-SRF2025-THP24}, language = {english} }

References

• D. Seal et al., “A LHe-free test facility for thin film SRF cavity testing”, in Proc. 22st International Conference on RF Superconductivity (SRF'25), Tokyo, Japan, Sep. 2025, paper THP24, pp. 654-660.