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[n]	F. Becker, F. M. Bieniosek, P. Forck, D. H. H. Hoffmann, and P. N. Ni, “Beam Induced Fluorescence (BIF) Monitor for Intense Heavy Ion Beams”, in Proc. BIW'08, Lake Tahoe, CA, USA, May 2008, paper TUPTPF054, pp. 236-240. 

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