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[n]	N. Simos, G. Atoian, H. Ludewig, N. V. Mokhov, J. G. O, and S. N. White, “Grad-Level Radiation Damage of SiO2 Detectors”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper TH5RFP017, pp. 3479-3481. 

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