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[n]	W. H. Park et al., “A DC/DC Converter Test Board and Control System”, in Proc. ICALEPCS'03, Gyeongju, Korea, Oct. 2003, paper MP537, pp. XX-XX. 
[n]	M. Veronese et al., “New Combined Function Wire Scanner-Screen Station for the High Resolution Transverse Profile Measurements at FERMI”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 322-325. doi:10.18429/JACoW-IBIC2019-TUPP014

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