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[n]	S. Yu, E. Henestroza, S. Eylon, and M. Vella, “Electron Beam 3.5MV, 2ka Injector Diode Diagnostics for the DARHT Facility”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper TUB06, pp. 443-445. 

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